Ion Beam Technology Market Statistics & Facts | CAGR 7%

  • Ion beam systems have been commercially produced, primarily for large semiconductor manufacturers, for more than twenty years now. These systems use focused ion beams that can be operated at high-beam currents for site-specific milling or sputtering, or at low-beam currents for imaging. In addition, ion beam technology is also commonly used to prepare samples for TEMs (Transmission Electron Microscopes).
  • Ion beam technology is widely applied in the fields of material science and biological science on its coupling with an SEM column to develop a dual-beam FIB (Focused Ion Beam) system. Moreover, new advancements are being constantly carried out for nanotechnology and material characterization.
  • The global ion beam technology market is projected to expand at a CAGR of over 7% during the forecast period, and reach value of around US$ 780 Mn by 2027.

Global Ion Beam Technology Market: Regional Overview

  • In 2018, the ion beam technology market in Asia Pacific generated the highest revenue across the world.
  • The dominance of the region’s ion beam technology market is anticipated to further increase in the near future, owing to the presence of a large number of market players, coupled with extensive research and development activities taking place in the field of ion beam technology. Moreover, high penetration of nanotechnology in developing countries, such as China and India, is projected to drive the ion beam technology market in the region during the forecast period.

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  • Furthermore, although North America is expected to lose some of its share in the global ion beam technology market by the end of the forecast period, it is likely to maintain its second-largest position in the global ion beam technology market during the forecast period.

Global Ion Beam Technology Market: Trends

  • A key trend that impacts the global ion beam technology market is the increasing use of focused ion beams for failure analysis.
  • Common causes of failure include manufacturing defects, design errors, misuse, assembly errors, improper maintenance, inadequate quality assurance, unforeseen operating conditions, and improper heat treatments.
  • Focused ion beam systems are particularly effective in analyzing invisible defects from the surface of materials.